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| 008 | 180112s9999||||xx |||||||||||||| ||und|| | ||
| 020 | _a9789380501550 | ||
| 082 | _a621.395 | ||
| 100 | _aWANG LAUNG TERNG;CHENG WEN WU;XIAOQING WEN | ||
| 245 | 0 | _aVLSI TEST PRINCIPLES AND ARCHITECTURES DESIGN FOR TESTABILITY | |
| 260 |
_aNEW DELHI _bELSEVIER _c2013 |
||
| 300 | _a777 | ||
| 650 | _a"Digital Logic,CMOS VLSI Design" | ||
| 942 | _cGEN_BK | ||
| 999 |
_c8107 _d8107 |
||