VLSI TEST PRINCIPLES AND ARCHITECTURES DESIGN FOR TESTABILITY

TextPublication details: NEW DELHI ELSEVIER 2013 Description: 777ISBN: 9789380501550Subject(s): "Digital Logic,CMOS VLSI Design"DDC classification: 621.395

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
General Library Books	Central Library Ref-5-EC-TE	ELECTRONICS & COMMUNICATION ENGG	621.395 WAN (Browse shelf(Opens below))	Available		060863

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