PRINCIPLES OF TESTING ELECTRONIC SYSTEMS
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TextPublication details: NEWYORK JOHN WILEY & SONS 2000 Description: 420ISBN: 978-0471319317Subject(s): "Components & Circuits-(Integrated,analog,digital)"DDC classification: 621.381 5
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Central Library 2nd Floor-Cup-89(Mix) | ELECTRONICS & COMMUNICATION ENGG | 621.381 5 MOU (Browse shelf(Opens below)) | Available | 045579 |
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| 572.49 RAS SYSTEM ON A CHIP VERIFICATION METHODOLOGY AND TECHNIQUES | 572.49 RAS SYSTEM ON A CHIP VERIFICATION METHODOLOGY AND TECHNIQUES | 621.381 5 BLE BOUNDARY SCAN TEST | 621.381 5 MOU PRINCIPLES OF TESTING ELECTRONIC SYSTEMS | 621.3815 BEN NETWORKS ON CHIPS TECHNOLOGY AND TOOLS | 621.3815 BEN NETWORKS ON CHIPS TECHNOLOGY AND TOOLS | 621.39 5 CHI ALGORITHMS AND DATA STRUCTURES IN VLSI DESIGN |
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